My research experience and interests cover several fields of materials fabrication and characterization. I have been involved in the growth and characterization of various thin film and multilayer systems including epitaxial heterostructures (III-V and group IV semiconductors, such as InGaAs, GaN, AlGaN, SiGe, SiSn, etc.), nitrides (TiN, CrN, etc.), oxides (SiOx, STO, LMO, etc.), and metals (Cr, Ni, Co and related silicides) by various growth techniques including MBE, PLD, ALD, sputtering, etc. I have also been involved in the fabrication of nanomaterials (nanoparticles such as Fe oxides and Au), soft materials and bio materials, including a recent project on microstructural changes of wood under fungi attack and deterioration. I have considerable hands-on experience on all x-ray analysis techniques with a focus on diffraction and scattering methods, applied to materials systems ranging from steel, metals, superlattices, superconducting structures, oxides, and nitrides, to soft/bio materials (polymers, lipids, proteins, etc.). I have also been involved in surface analytical methods including SIMS, XPS and Auger electron spectroscopy, spanning years of commercial analytical work in a corporate environment. I am particularly fascinated by multi-technique characterization methods and issues involving technique development and cross-technique comparison.